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DDR Memory

DDR Memory DDR Memory

DDR test challenges in the era of 5G technology

Adoption of 5G is driving growth in a variety of exciting technologies – from augmented reality (AR) and artificial intelligence (AI) to cloud computing and IoT. All of these rely on more data being both stored and accessed more quickly, hence the importance of fifth generation memory (DDR5). DDR5 improves bandwidth, density and channel efficiency, but higher data transfer rates and faster signal speeds lead to complex designs that push the boundaries of signal integrity and require higher performance measurements for DDR compliance test, DDR debug and validation.

DDR Memory Testing Solutions

Semiconductor Devices to Market Faster

DDR5

The TekExpress DDR5 Transmitter solution conforms to the JEDEC memory standard requirements so you can spend more time validating the memory design and less time collecting the data. DDR5 test automation software option is available on MSO / DPO70000 Mixed Signal Oscilloscopes and DPO70000SX ATI Performance Oscilloscopes.

Key Features:

  • DDR DFE standalone application
  • DFE analysis on the bursty DDR traffic and write data eye measurements
  • De-embedding with SDLA
  • Up to 8400M T/s in user defined mode

 

Learn More:

TekExpress DDR5 Transmitter datasheet View DDR5 Brochure
Semiconductor Devices to Market Faster

LPDDR5

The TekExpress LPDDR5 Transmitter solution meets the latest JEDEC memory standard requirements so you can confidently validate LPDDR5 DRAM designs at the maximum data rates. Supported on MSO / DPO70000 Mixed Signal Oscilloscopes and DPO70000SX ATI Performance Oscilloscopes.

Key Features:

  • Automated read and write burst separation
  • De-embedding techniques using SDLA
  • Faster times for a faster time to market
  • Multiple Burst Detection Method supported - Read and Write, Write Only, Read Only, and Visual Search
  • Hexagon shape mask and margin analysis for Write Data, CA, CS Eye measurement

 

Learn More:

LPDDR5 Transmitter datasheet View LPDDR5 Brochure
Semiconductor Devices to Market Faster

DDR/LPDDR, Generations 3 and 4

Fast data rates, flexibility and proven technology make previous generations of DDR4, LPDDR4, DDR3 and LPDDR3 DRAMs extremely common in wearables, medical and IoT applications.

DDR4/LPDDR4 and DDR3/LPDDR3 test automation software is available for use with MSO / DPO70000 Mixed Signal Oscilloscopes and DPO70000SX ATI Performance Oscilloscopes. DDR3/LPDDR3 automation software is also available for use with Tektronix 6 Series B MSO Mixed Signal Oscilloscopes.

Key Features:

  • Easy identification of reads and writes
  • Automated setup and testing per JEDEC specifications
  • Automated report generation
  • Support for a wide range of interposers and high-performance probes

 

Learn More:

DDR/LPDDR Gens 3 and 4 Testing on MSO/DPO70000 and DPO70000SX Oscilloscopes DDR/LPDDR Gen 3 Testing on 6 Series MSO Oscilloscopes
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