DDR test challenges in the era of 5G technology

The TekExpress DDR5 Transmitter solution conforms to the JEDEC memory standard requirements so you can spend more time validating the memory design and less time collecting the data. DDR5 test automation software option is available on MSO / DPO70000 Mixed Signal Oscilloscopes and DPO70000SX ATI Performance Oscilloscopes.

Key Features:

• DDR DFE standalone application
• DFE analysis on the bursty DDR traffic and write data eye measurements
• De-embedding with SDLA
• Up to 8400M T/s in user defined mode

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The TekExpress LPDDR5 Transmitter solution meets the latest JEDEC memory standard requirements so you can confidently validate LPDDR5 DRAM designs at the maximum data rates. Supported on MSO / DPO70000 Mixed Signal Oscilloscopes and DPO70000SX ATI Performance Oscilloscopes.

Key Features:

• Automated read and write burst separation
• De-embedding techniques using SDLA
• Faster times for a faster time to market
• Multiple Burst Detection Method supported - Read and Write, Write Only, Read Only, and Visual Search
• Hexagon shape mask and margin analysis for Write Data, CA, CS Eye measurement

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Fast data rates, flexibility and proven technology make previous generations of DDR4, LPDDR4, DDR3 and LPDDR3 DRAMs extremely common in wearables, medical and IoT applications.

DDR4/LPDDR4 and DDR3/LPDDR3 test automation software is available for use with MSO / DPO70000 Mixed Signal Oscilloscopes and DPO70000SX ATI Performance Oscilloscopes. DDR3/LPDDR3 automation software is also available for use with Tektronix 6 Series B MSO Mixed Signal Oscilloscopes.

Key Features:

• Easy identification of reads and writes
• Automated setup and testing per JEDEC specifications
• Automated report generation
• Support for a wide range of interposers and high-performance probes

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