Understanding timing jitter has become a mandatory part of high-speed communications system design as today’s serial data standards require extensive jitter compliance tests. Tektronix' comprehensive test instrumentation portfolio enables you to meet your design goals and compliance requirements – fast.
DPOJET Jitter & Timing Analysis for Real-Time Oscilloscopes: DPOJET enables engineers to debug and characterize timing, jitter, and noise in computer, mobile, and data communication system designs.
TekScope AnywhereTM Waveform Analysis: Users now have the flexibility to perform timing, eye, and jitter analysis outside the lab that can easily be shared between team members in a networked environment.
80SJNB Jitter, Timing, and SDLA Visualizer Analysis for Sampling Oscilloscopes: 80SJNB is an all-purpose tool that enables engineers to specify a de-embed filter, Time Domain Waveform or S-Parameter for channel embedding. 80SJNB also performs timing, noise and mask testing analysis to get a 3-D view of the eye diagram performance for deep, accurate evaluation on signals with speeds beyond 50GHz.
JMAP Jitter Mapping and Decomposition Analysis for BERTScope BSA Series: Unlike a traditional BERT, BERTScope utilizes unique JMAP analysis to provide jitter decomposition into its random and deterministic components for a deeper understanding of errors on long patterns.
Whether you need a quick clock jitter measurement or a thorough analysis of a BER performance problem, Tektronix oscilloscopes and integrated software tools deliver. You can rapidly solve problems and meet your design goals and compliance requirements. |
Timing jitter is the unwelcome companion of all electrical systems that use voltage transitions to represent timing information. This paper focuses primarily on jitter in electrical systems. |
This webinar describes the different categories and types of jitter; the origins and interrelationships and how they can be used to diagnois, characterize and debug system hardware. Plus, explain how these various jitter measurements are applicable to your specific application. |