![icon_pwr-semiconductor](https://www.tek.com/-/media/sites/default/files/2017-12/icon_pwr-semiconductor.png)
Power Device Characterization
- Safe, Precise, Fast MOSFET Testing for Si, SiC and GaN devices
- Wide power envelope
- Safely set up your test
- 2X Faster Device Characterization for improved time to market
- Avoid expensive overdesigning of your wide bandgap device
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![](https://www.tek.com/-/media/images/applications/misc/icon_master-phasor-diagram.png)
Measurements on 3-Phase Variable Frequency Drives
- Perform stable measurements on PWM 3-phase motor drives
- Oscilloscope-based phasor diagrams
- Measure system efficiency
- DC bus measurements
- Support for 2V2I, 3V3I star and delta configuration, as well as DC-in/3-phase out.
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![icon_pwr-conv-design](https://www.tek.com/-/media/sites/default/files/2017-12/icon_pwr-conv-design.png)
SiC and GaN Power Conversion
- Overcome high common mode voltages
- Simultaneously measure multiple control and timing signals
- Faster automated power measurements
- Don't fail compliance
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![icon_pwr-conv-design](https://www.tek.com/-/media/sites/default/files/2022-08/icon_double-pulse-testing.png)
Double Pulse Testing
- Measure turn-on and turn-off energy loss
- Measure reverse recovery
- Automated oscilloscope measurements
- Easily generate gate drive signals
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![icon_max-battery-life](https://www.tek.com/-/media/sites/default/files/2017-12/icon_max-battery-life.png)
Maximizing Battery Life of IoT Devices
- Determine the load current profile
- Simulate any battery
- Model any type of battery
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![](https://www.tek.com/-/media/images/applications/misc/icon_control_loop_analysis.png)
Control Loop Analysis
- Oscilloscope-based response measurement setup
- Probe characteristics for control loop measurements
- Measure stability margins with Bode plots
- Control loop analysis system
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![](https://www.tek.com/-/media/images/applications/misc/icon_power_supply_measurement_analysis.png)
Power Supply Measurement and Analysis
- Switching loss measurement and analysis
- In-circuit inductor and transformer measurements
- GaN and SiC switching device measurements
- Safe operating area (SOA)
- Power supply rejection ratio
- Control loop response
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![](https://www.tek.com/-/media/images/applications/misc/analyzing-power-integrity-on-pdn.png)
Analyzing Power Integrity on a PDN
- Measure high-frequency ripple without blocking DC
- Dealing with supplies from 1 V to 48 V and above
- Minimizing measurement system noise contribution
- PDN impedance measurements
- Noise-hunting with synchronized spectrums and waveforms
- Automated power rail measurements
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![](https://www.tek.com/-/media/images/applications/misc/icon_master-phasor-diagram.png)
Automated Parametric Test
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Fully-automated HV Wafer-level testing
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Move from high voltage to low voltage without changing test setup
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Measure capacitance without manual reconfiguration Fast automation
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