Power Device Characterization

• Safe, Precise, Fast MOSFET Testing for Si, SiC and GaN devices
• Wide power envelope
• Safely set up your test
• 2X Faster Device Characterization for improved time to market
• Avoid expensive overdesigning of your wide bandgap device

Measurements on 3-Phase Variable Frequency Drives

• Perform stable measurements on PWM 3-phase motor drives
• Oscilloscope-based phasor diagrams
• Measure system efficiency
• DC bus measurements
• Support for 2V2I, 3V3I star and delta configuration, as well as DC-in/3-phase out.

SiC and GaN Power Conversion

• Overcome high common mode voltages
• Simultaneously measure multiple control and timing signals
• Faster automated power measurements
• Don't fail compliance

Double Pulse Testing

• Measure turn-on and turn-off energy loss
• Measure reverse recovery
• Automated oscilloscope measurements
• Easily generate gate drive signals

Maximizing Battery Life of IoT Devices

• Determine the load current profile
• Simulate any battery
• Model any type of battery

Control Loop Analysis

• Oscilloscope-based response measurement setup
• Probe characteristics for control loop measurements
• Measure stability margins with Bode plots
• Control loop analysis system

Power Supply Measurement and Analysis

• Switching loss measurement and analysis
• In-circuit inductor and transformer measurements
• GaN and SiC switching device measurements
• Safe operating area (SOA)
• Power supply rejection ratio
• Control loop response

Analyzing Power Integrity on a PDN

• Measure high-frequency ripple without blocking DC
• Dealing with supplies from 1 V to 48 V and above
• Minimizing measurement system noise contribution
• PDN impedance measurements
• Noise-hunting with synchronized spectrums and waveforms
• Automated power rail measurements
   

Automated Parametric Test

• Fully-automated HV Wafer-level testing

• Move from high voltage to low voltage without changing test setup

• Measure capacitance without manual reconfiguration Fast automation