New semiconductor materials, such as SiC and GaN, often introduce unique challenges during development.

• DC semiconductor characterization requires comprehensive I-V, C-V and fast pulsed measurements.
   
• Testing high power semiconductor devices drives the need for higher voltages and power levels, faster switching times, higher peak currents and lower leakage currents.
   
• Semiconductor production environments need automation, probe station integration, speed and throughput for die sort, wafer acceptance and reliability tests.

High speed digital interfaces necessitate faster PHY validation cycles. Speedier debugging, protocol decoding and identifying jitter & noise from sources such as crosstalk are critical requirements for designers.

So many electrical validation tests, so little time!

• Keithley Source Measure Units (SMUs): Source and simultaneously measure current or voltage with high speed and accuracy.
   
• Keithley Parametric Analyzers: Perform I-V and C-V measurement sweeps, ultra-fast pulse and transient I-V measurements
   
• Oscilloscopes: 8 out of 10 engineers around the world trust our scopes to help them debug and test tomorrow's designs faster