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USB Testing Solutions

USB Testing Solutions USB Testing Solutions

Efficient Tools for USB Testing

Universal Serial Bus (USB) is the most widely adopted serial interface since 1996. From five-cent USB keys to high-end servers, an estimated 2+ billion USB interfaces and cables are created every year.

Tektronix offers a comprehensive automated solution for USB silicon, host, device, and hub testing and debugging. Our software provides fast and accurate measurement results and reduces testing complexities like setup, configuration, and instrument control.

USB4™, USB Type-C® and USB-C® are trademarks of the Universal Serial Bus Implementers Forum (USB-IF).

Comprehensive Automated Solutions for USB

Semiconductor Devices to Market Faster

USB4™ Transmitter

Released in 2019, the latest version of the USB Standard brings a variety of new challenges like signal integrity, device control and increased test times. Tektronix’s certified USB4 Transmitter Solution is designed to streamline the USB4 validation process:

  • Render eye diagrams with extrapolation and analyze channel effect on signals using worst-case channel models
  • In-depth debugging insight including jitter, noise, eye height/width and visualization plots
  • Offline waveform analysis to collaborate with your global teams and reduce time to market
View the USB4 Tx Datasheet View USB4 Brochure
Semiconductor Devices to Market Faster

USB4 Receiver

Ever-increasing data rates make designing and testing USB receivers both difficult and expensive, especially at the highest speeds. USB Rx compliance testing requires performing the complex process of stressed eye calibration for both short and long channels at a variety of sinusoidal jitter (SJ) frequencies. The performing process can be quite difficult and time-consuming when performed manually.

Tektronix and Anritsu have collaborated to offer a joint solution for USB4 receiver testing that integrates the Anritsu BERT MP1900A with a Tektronix DPO70000SX real-time oscilloscope to simplify this process. Our joint solution automates the entire calibration and measurement process, shortening test time and producing more reliable measurements.

View the USB4 Rx Datasheet
Semiconductor Devices to Market Faster

USB 3.2

The USB 3.2 specification (20 Gbps) absorbed the prior USB 3.0 (5 Gbps) and USB 3.1 (5 or 10 Gbps) specifications, and also introduces Dual-Lane (x2) operation.

Tektronix’s USB 3.2 automated compliance test solution supports compliance testing for the silicon, host, device, hub, and dock. Since USB 3.2 encompasses three different certifications (Gen 1, Gen 2, and Gen 2x2), we designed our solution to save you time by letting you test for compliance with all three certifications in a single piece of software.

Learn more about our USB 3.2 Transmitter Solution
Semiconductor Devices to Market Faster

USB 2.0

USB 2.0 is a popular interface for mid-speed applications, thanks to its proven track record and widespread support. Tektronix offers tools for evaluating signal integrity against USBIF standards, and protocol decoding for system-level debugging:

  • Tektronix USB 2.0 automated compliance testing software provides one-button testing for USB 2.0 designs, supporting low-speed, full-speed and high-speed data rates.
  • The Tektronix TDSUSBF fixture set provides a probing solution for the low- and full-speed signal quality, inrush current, drop and droop, receiver sensitivity, and impedance measurement tests

 

Tektronix USB 2.0 decoder solutions offers automated trigger, decode, and search for low-speed, full-speed and high-speed USB buses, enabling fast and efficient validation and debug.

To learn more, explore our datasheets on USB 2.0 Automated Compliance Testing on 5 and 6 Series MSOs, USB 2.0 Decoding on 3 Series MDO, 4/5/6 Series MSOs and USB 2.0 Compliance and Decode Software for MSO/DPO70000 and DPO70000SX

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